@article{844171,
author = {T Gougousi and Y Xu and J Kidder and G Rubloff and Charles Tilford},
title = {Process Diagnostics and Thickness Metrology Using in Situ Mass Spectrometry for the Chemical Vapor Deposition of W from H2/WF6},
year = {2000},
number = {18},
month = {2000-05-01 00:05:00},
publisher = {Journal of Vacuum Science and Technology B},
language = {en},
}