@article{844171, author = {T Gougousi and Y Xu and J Kidder and G Rubloff and Charles Tilford}, title = {Process Diagnostics and Thickness Metrology Using in Situ Mass Spectrometry for the Chemical Vapor Deposition of W from H2/WF6}, year = {2000}, number = {18}, month = {2000-05-01 00:05:00}, publisher = {Journal of Vacuum Science and Technology B}, language = {en}, }