@conference{842701,
  author = {J.T. Ryan and Patrick Lenahan and A.T. Krishnan and S. Krishnan and Jason Campbell},
  title = {An Electrically-Detected Magnetic Resonance Study of the Atomic-Scale Effects of Fluorine on the Negative Bias Temperature Instability},
  year = {2009},
  month = {2009-01-05 00:01:00},
  publisher = {2008 IEEE International Integrated Reliability Workshop, South Lake Tahoe, NV, US},
  url = {https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=900189},
  language = {en},
}