@conference{842581,
  author = {Joseph Kopanski and Muhammad Afridi and Stoyan Jeliazkov and Weirong Jiang and Thomas Walker},
  title = {Scanning Kelvin Force Microscopy For Characterizing Nanostructures in Atmosphere},
  year = {2007},
  month = {2007-09-30 00:09:00},
  publisher = {International Conference on Frontiers of Characterization and Metrology for Nanoelectronics, Gaithersburg, MD, USA},
  url = {https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=32648},
  language = {en},
}