@conference{840651,
  author = {Theodore Vorburger and Ronald Dixson and Joseph Fu and Ndubuisi Orji and Shaw Feng and Michael Cresswell and Richard Allen and William Guthrie and Wei Chu},
  title = {Nano- and Atomic-Scale Length Metrology},
  year = {2006},
  month = {2006-01-01 00:01:00},
  publisher = {Proceedings of International Symposium on Instrumentation Science and Technology, Harbin, 1, CH},
  language = {en},
}