@conference{837881,
  author = {N Armstrong and W Kalceff and James Cline and John Bonevich},
  title = {A Bayesian/Maximum Entropy Method for the Certification of a Nanocrystallite-Size NIST Standard Reference Material},
  year = {2004},
  number = {68},
  month = {2004-07-01 00:07:00},
  publisher = {Analysis of Microstructure and Residual Stress by Diffraction Methods, International Conference | 3rd| Diffraction Analysis of the Microstructure of Materials | Springer, Trento, 1, IT},
  language = {en},
}