@article{830356,
  author = {Lin You and Chukwudi Okoro and Jungjoon Ahn and Joseph Kopanski and Yaw Obeng and Rhonda Franklin},
  title = {Broad-Band Microwave-Based Metrology Platform Development: Demonstration of In-Situ Failure Mode Diagnostic Capabilities for Integrated Circuit Reliability Analyses},
  year = {2014},
  number = {4},
  month = {2014-11-07 00:11:00},
  publisher = {ECS Journal of Solid State Science and Technology},
  doi = {https://doi.org/10.1149/2.0151501jss},
  language = {en},
}