@article{819981, author = {Quentin Smets and Anne Verhulst and Eddy Simoen and David Gundlach and Curt Richter and Nadine Collaert and Marc Heyns}, title = {Calibration and impact of bulk trap-assisted tunneling and Shockley-Read-Hall currents in InGaAs tunnel-FETs}, year = {2017}, number = {64}, month = {2017-09-01 00:09:00}, publisher = {IEEE Electron Device Letters}, doi = {https://doi.org/10.1109/TED.2017.2724144}, language = {en}, }