@article{819886,
  author = {David Nminibapiel and Dmitry Veksler and Pragya Shrestha and Jason Campbell and Jason Ryan and Helmut Baumgart and Kin Cheung},
  title = {Impact of RRAM Read Fluctuations on the Program-Verify Approach},
  year = {2017},
  month = {2017-05-22 00:05:00},
  publisher = {IEEE Electron Device Letters},
  url = {https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=922878},
  language = {en},
}