@article{818876,
  author = {Gordon MacDonald and Frank DelRio and Jason Killgore},
  title = {Higher-Eigenmode Piezoresponse Force Microscopy: A Path Towards Increased Sensitivity and the Elimination of Electrostatic Artifacts},
  year = {2018},
  number = {2},
  month = {2018-03-23 00:03:00},
  publisher = {Nano Futures},
  url = {https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=924677},
  doi = {https://doi.org/10.1088/2399-1984/aab2bc},
  language = {en},
}