@conference{817856,
  author = {Lin You and Chukwudi Okoro and Jungjoon Ahn and Joseph Kopanski and Yaw Obeng},
  title = {Microwave-Based Metrology Platform Development: Application of Broad-Band RF Metrology to Integrated Circuit Reliability Analyses},
  year = {2014},
  month = {2014-05-12 00:05:00},
  publisher = {ECS Trasnsaction: Moore-Than-More 2, Orlando, FL, US},
  language = {en},
}