@article{808216,
  author = {Duane McCrory and Mark Anders and Jason Ryan and Pragya Shrestha and Kin Cheung and Patrick Lenahan and Jason Campbell},
  title = {Wafer-Level Electrically Detected Magnetic Resonance:Magnetic Resonance in a Probing Station},
  year = {2018},
  number = {18},
  month = {2018-03-20 00:03:00},
  publisher = {IEEE Transactions on Device and Materials Reliability},
  url = {https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=925603},
  language = {en},
}