@article{804071,
  author = {Chad Snyder and F Mopsik},
  title = {A Precision Capacitance Cell for Measurement of Thin Film Out-of-Plane Expansion Part III. Conducting and Semiconducting Materials},
  year = {2001},
  number = {50},
  month = {2001-10-01 00:10:00},
  publisher = {IEEE Transactions on Instrumentation and Measurement},
  url = {https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=852836},
  language = {en},
}