@article{794211,
  author = {Bin Wang and John Suehle and Eric Vogel and J Bernstein},
  title = {Time Dependent Breakdown of Ultra-Thin Gate Dielectrics Under Pulsed Biased Stress},
  year = {2001},
  number = {22},
  month = {2001-03-01 00:03:00},
  publisher = {IEEE Electron Device Letters},
  language = {en},
}