@conference{791901,
  author = {Papa Amoah and Jesus Perez and Yaw Obeng},
  title = {Application of Broadband RF Metrology to Integrated Circuit Interconnect Reliability Analyses: Monitoring Copper Interconnect Corrosion in 3D-ICs},
  year = {2020},
  month = {2020-06-04 00:06:00},
  publisher = {2020 INTERNATIONAL CONFERENCE ON MICROELECTRONIC TEST STRUCTURES, April 6-9, EDINBURGH, UNITED 
KINGDOM, Edinburgh, UK},
  url = {https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=929468},
  doi = {https://doi.org/10.1109/ICMTS48187.2020.9107926.},
  language = {en},
}