@conference{791221,
  author = {Nick Fletcher and Gert Rietveld and James Olthoff and Ilya Budovsky},
  title = {Predicted impact of latest h and e values on resistance and voltage traceability in the new SI (Systeme International)},
  year = {2014},
  month = {2014-10-02 00:10:00},
  publisher = {Conference on Precision Electromagnetic Measurements, Rio de Janeiro, BR},
  doi = {https://doi.org/10.1109/CPEM.2014.6898444},
  language = {en},
}