@article{791161,
  author = {Duane McCrory and Mark Anders and Jason Ryan and Pragya Shrestha and Kin Cheung and Patrick Lenahan and Jason Campbell},
  title = {Slow- and rapid-scan frequency-swept electrically detected magnetic resonance of MOSFETs with a non-resonant microwave probe within a semiconductor wafer-probing station},
  year = {2019},
  number = {90},
  month = {2019-01-14 00:01:00},
  publisher = {Review of Scientific Instruments},
  url = {https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=926629},
  doi = {https://doi.org/10.1063/1.5053665},
  language = {en},
}