@article{790946,
  author = {Binhui Hu and Erick Ochoa and Daniel Sanchez and Justin Perron and Neil Zimmerman and Michael Stewart},
  title = {Effect of device design on charge offset drift in Si/SiO2 single electron devices},
  year = {2018},
  number = {124},
  month = {2018-10-09 00:10:00},
  publisher = {Journal of Applied Physics},
  url = {https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=926169},
  doi = {https://doi.org/10.1063/1.5048013},
  language = {en},
}