@inbook{790081,
  author = {Nicholas Clore and Dennis Fritz and Wei-Hsun Chen and Maureen Williams and John Blendell and Carol Handwerker},
  title = {Chapter 7: Quantitative Assessment of Stress Relaxation in Tin Films by the Formation of Whiskers, Hillocks, and Other Surface Defects},
  year = {2016},
  month = {2016-03-15 00:03:00},
  publisher = {Mitigating Tin Whisker Risks: Theory and Practice, John Wiley & Sons, Hoboken, NJ},
  language = {en},
}