@article{783926,
  author = {Emmanouel Hourdakis and J Wahl and Neil Zimmerman},
  title = {Lack of charge offset drift is a robust property of Si single electron transistors},
  year = {2008},
  month = {2008-02-12 00:02:00},
  publisher = {Applied Physics Letters},
  url = {https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=840905},
  doi = {https://doi.org/10.1063/1.2841659},
  language = {en},
}