@article{779491,
  author = {A. Martin and P. O'Sullivan and A. Mathewson and John Suehle and P Chaparala},
  title = {Investigation of the Influence of Ramped Voltage Stress on Intrinsic tbd of MOS Gate Oxides},
  year = {1997},
  number = {41},
  month = {1997-12-31 00:12:00},
  publisher = {Solid-State Electronics},
  language = {en},
}