@conference{779081,
  author = {Harry Schafft and John Albers},
  title = {Thermal Interactions Between Electromigration Test Structures},
  year = {1988},
  month = {1988-12-31 00:12:00},
  publisher = {Proc., IEEE International Conference on Microelectronic Test Structures, Long Beach, CA, USA},
  language = {en},
}