@conference{779076, author = {J. Prendergast and John Suehle and P Chaparala and E. Murphy and M. Stephenson}, title = {TDDB Characterization of Thin SiO2 Films With Bimodal Failure Populations}, year = {1995}, month = {1995-12-31 00:12:00}, publisher = {Proc., 1995 International Reliability Physics Symposium, Las Vegas, NV, USA}, language = {en}, }