@conference{779076,
  author = {J. Prendergast and John Suehle and P Chaparala and E. Murphy and M. Stephenson},
  title = {TDDB Characterization of Thin SiO<sub>2</sub> Films With Bimodal Failure Populations},
  year = {1995},
  month = {1995-12-31 00:12:00},
  publisher = {Proc., 1995 International Reliability Physics Symposium, Las Vegas, NV, USA},
  language = {en},
}