@article{776466,
  author = {John Suehle and P Chaparala},
  title = {Low Electric Field Breakdown of Thin SiO<sub>2</sub> Films under Static and Dynamic Stress},
  year = {1997},
  number = {44},
  month = {1997-05-01 00:05:00},
  publisher = {IEEE Transactions on Electron Devices},
  language = {en},
}