@conference{775836, author = {Roy Geiss and David Read}, title = {Need for Standardization of EBSD Measurements for Microstructural Characterization of Thin Film Structures}, year = {2007}, month = {2007-03-05 00:03:00}, publisher = {AIP Conference Proceedigs, Gaithersburg, MD, USA}, url = {https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=50521}, language = {en}, }