@conference{772561,
  author = {Jens Mueller and Davor Balzar and Roy Geiss and David Read and Robert Keller},
  title = {COMPARISON OF TEXTURE IN COPPER AND ALUMINUM THIN FILMS AS DETERMINED BY XRD AND EBSD},
  year = {2006},
  month = {2006-10-02 00:10:00},
  publisher = {Advances in X-Ray Analysis, Colorado Springs, CO, USA},
  url = {https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=50205},
  language = {en},
}