@conference{772081,
  author = {Robert Keller and Roy Geiss and Yi-Wen Cheng and David Read},
  title = {Electric Current Induced Thermomechanical Fatigue Testing of Interconnects},
  year = {2005},
  number = {788},
  month = {2005-03-01 00:03:00},
  publisher = {Proc. Intl. Conf. on Characterization and Metrology for ULSI Technology, Austin, TX, USA},
  url = {https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=50110},
  language = {en},
}