@conference{771556,
  author = {R Koning and Ronald Dixson and Joseph Fu and V Tsai and Theodore Vorburger and Edwin Williams and X Wang},
  title = {Pitch and Step Height Measurements Using NIST},
  year = {1997},
  month = {1997-01-01 00:01:00},
  publisher = {Proceedings of 2nd Seminar on Quantitative Microscopy, , PTB Report F-30, K. Hasche, W. Mirande, and G. Wilkening, Editors, PTB Braunschweig, 1, GE},
  language = {en},
}