@article{770401,
  author = {Eric Vogel and Da-Wei Heh and J Bernstein},
  title = {Impact of the Trapping of Anode Hot Holes on Silicon Dioxide Breakdown},
  year = {2002},
  number = {23},
  month = {2002-11-01 00:11:00},
  publisher = {IEEE Electron Device Letters},
  language = {en},
}