@article{769821, author = {Yun Wang and Kin Cheung and Y.J. Choi and Byoung Lee}, title = {An Accurate Capacitance-Voltage Measurement Method for Highly Leaky Devices}, year = {2008}, number = {55}, month = {2008-09-01 00:09:00}, publisher = {IEEE Transactions on Electron Devices}, url = {https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=32746}, language = {en}, }