@conference{766836,
  author = {G. Campisi and Peter Roitman and G. Shontz},
  title = {The Role of Annealing Conditions on the Radiation Response of Backgate MOSFETs, Extended Abstract},
  year = {1991},
  month = {1991-12-31 00:12:00},
  publisher = {Proc., Third Workshop on Radiation-Induced and/or Process-Related Electrically Active Defects in Semiconductor-Insulator Systems, Research Triangle Park, NC, USA},
  language = {en},
}