@conference{761201,
  author = {Jonathan Guyer and W. Tseng and W. Thurber and Eric Vogel and Monica Edelstein and Donald Gajewski and Joseph Pellegrino},
  title = {In Situ Diffuse Reflectance Spectroscopy for Measurement and Control of III-V Molecular Beam Epitaxy},
  year = {2000},
  month = {2000-03-17 00:03:00},
  publisher = {Proc., Materials Research Society Symposium, Boston, MA, USA},
  language = {en},
}