@conference{761101,
  author = {R.H. Geiss and Alexana Roshko and Kristine Bertness and T Keller},
  title = {Electron Backscatter Diffraction for Studies of Localized Deformation},
  year = {2003},
  month = {2003-03-01 00:03:00},
  publisher = {Proc., 2003 TMS Annual Meeting, in Electron Microscopy: Its Role in Materials Science, eds. J.R. Weertman, M. Fine, K. Faber, W. King, and P. Liaw, San Diego, CA, USA},
  url = {https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=31485},
  language = {en},
}