@article{760606,
  author = {Eric Vogel and John Suehle and Bin Wang and Y Chen and J Bernstein},
  title = {Reliability of Ultra-Thin Silicon Dioxide Under Combined Substrate Hot Electron and Constant Voltage Tunneling Stress},
  year = {2000},
  number = {47},
  month = {2000-06-01 00:06:00},
  publisher = {IEEE Transactions on Electron Devices},
  language = {en},
}