@conference{760531,
  author = {John Suehle and P Chaparala and C. Messick and W. Miller and K. Boyko},
  title = {Field and Temperature Acceleration of Time-Dependent Dielectric Breakdown in Intrinsic Thin SiO<sub>2</sub>},
  year = {1994},
  month = {1994-12-31 00:12:00},
  publisher = {Proc., 1994 IEEE International Reliability Physics Symposium, San Jose, CA, USA},
  language = {en},
}