@article{760016,
  author = {Ranbir Singh and Allen Hefner Jr.},
  title = {Reliability of SiC MOS Devices},
  year = {2004},
  number = {48},
  month = {2004-06-24 00:06:00},
  publisher = {Journal of Solid-state Electronics},
  url = {https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=31577},
  language = {en},
}