@misc{759576,
  author = {Donald Gajewski and Jonathan Guyer and Joseph Pellegrino},
  title = {Spectroscopic Ellipsometry: In Situ Monitor and Control of III-V Semiconductors Grown by Molecular Beam Epitaxy},
  year = {1999},
  month = {1999-02-19 00:02:00},
  publisher = {NIST Interagency/Internal Report (NISTIR), National Institute of Standards and Technology, Gaithersburg, MD},
  language = {en},
}