@conference{758866,
  author = {Harvey Wohlwend and Gino Crispieri and Ya-Shian Li-Baboud},
  title = {Advancing Towards Factory-Wide Data Quality for APC Applications},
  year = {2006},
  month = {2006-09-30 00:09:00},
  publisher = {AEC/APC Symposium XVIII, Westminster, CO, USA},
  url = {https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=32423},
  language = {en},
}