@conference{758446,
  author = {David Berning and Allen Hefner Jr. and J Rodriguez and Colleen Hood and Angel Rivera},
  title = {Generalized Test Bed for High-Voltage, High-Power SiC Device Characterization},
  year = {2006},
  month = {2006-10-01 00:10:00},
  publisher = {Proc., IEEE Industrial Applications Society Meeting, Tampa, FL, USA},
  url = {https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=32317},
  language = {en},
}