@article{758431,
  author = {Jin-Ping Han and Eric Vogel and Evgeni Gusev and C. D'Emic and Curt Richter and Da-Wei Heh and John Suehle},
  title = {Asymmetric Energy Distribution of Interface Traps in n- & p- MOSFETs with HfO2 Gate Dielectric on Ultra-thin SiON Buffer Layer},
  year = {2004},
  number = {25},
  month = {2004-03-01 00:03:00},
  publisher = {Electron Device Letters},
  url = {https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=31451},
  language = {en},
}