@conference{758121,
  author = {James Randa and Susan Sweeney and Tom McKay and Dave Walker and David Greenberg and Jon Tao and Judah Mendez and G. Rezvani and John Pekarik},
  title = {INTER-LABORATORY COMPARISON OF NOISE-PARAMETER MEASUREMENTS ON CMOS DEVICES WITH 0.12 um GATE LENGTH},
  year = {2005},
  month = {2005-12-01 00:12:00},
  publisher = {66TH ARFTG MICROWAVE MEASUREMENTS CONFERENCE, Washington, DC, USA},
  url = {https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=32120},
  language = {en},
}