@conference{758061,
  author = {Baozhong Zhu and John Suehle and Joseph Berstein},
  title = {Mechanism of Dynamic NBTI of pMOSFETs},
  year = {2004},
  month = {2004-10-21 00:10:00},
  publisher = {Proc. Integrated Reliability Workshop, Lake Tahoe, CA, USA},
  url = {https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=31642},
  language = {en},
}