@conference{757906,
  author = {Hao Xiong and John Suehle},
  title = {Spatial Probing of Traps in nMOSFET with ALD HfO2/SiO2 Stacks Using Low Frequency Noise Characteristics},
  year = {2006},
  month = {2006-10-15 00:10:00},
  publisher = {IEEE International Integrated Reliability Workshop Final Report, Fallen Leaf, CA, USA},
  language = {en},
}