@conference{757786,
  author = {Baozhong Zhu and John Suehle and Eric Vogel and Joseph Berstein},
  title = {The Contribution of HfO2 Bulk Oxide Traps to Dynamic NBTI in pMOSFETs},
  year = {2005},
  month = {2005-04-20 00:04:00},
  publisher = {IEEE International Reliability Physics Symposium Proceedings, San Jose, CA, USA},
  url = {https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=31914},
  language = {en},
}