@conference{757676,
  author = {Emre Yarimbiyik and Harry Schafft and Richard Allen and Mona Zahgoul and David Blackburn},
  title = {Resistivity of Nanometer-Scale Films and Interconnects: Model and Simulation},
  year = {2005},
  month = {2005-10-20 00:10:00},
  publisher = {IEEE International Integrated Reliability Workshop Final Report, Lake Tahoe, CA, USA},
  language = {en},
}