@conference{757371,
  author = {Qiliang Li and Sang-Mo Koo and Hao Xiong and Monica Edelstein and John Suehle and Xiaoxiao Zhu and D. Ioannou and Curt Richter},
  title = {Methods to Characterize the Electrical and Mechanical Properties of Si Nanowires},
  year = {2007},
  month = {2007-09-30 00:09:00},
  publisher = {International Conference on Frontiers of Characterization and Metrology for Nanoelectronics, Gaithersburg, MD, USA},
  url = {https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=32634},
  language = {en},
}