@conference{757326,
  author = {Madelaine Hernandez and Adwoa Akuffo and Colleen Hood and Jose Ortiz and Allen Hefner Jr.},
  title = {Experimental Evaluation of SiC PiN Diode Forward Bias Degradation and Long Term Stability},
  year = {2007},
  month = {2007-06-21 00:06:00},
  publisher = {Proc., Power Electronics Specialist Conference, Orlando, FL, USA},
  url = {https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=32667},
  language = {en},
}