@conference{753936,
  author = {X. Han and Gerard Stenbakken and F. Von Zuben and Hans Engler},
  title = {Application of Neural Networks in the Development of Nonlinear Error Modeling and Test Point Prediction},
  year = {2000},
  number = {2},
  month = {2000-05-01 00:05:00},
  publisher = {Proc. IEEE Instrumentation and  Technology Conference (IMTC), Baltimore, MD},
  url = {https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=7751},
  language = {en},
}