@article{7091,
  author = {Jason Ryan and Richard Southwick and Jason Campbell and Kin Cheung and John Suehle and Anthony Oates},
  title = {Frequency-Modulated Charge Pumping: Defect Measurements with High Gate Leakage},
  year = {2013},
  month = {2013-02-28},
  publisher = {IEEE Electron Device Letters},
  doi = {https://doi.org/10.1109/LED.2013.2251315},
  language = {en},
}