@article{7086,
  author = {Jason Ryan and Jibin Zou and Jason Campbell and Richard Southwick and Kin Cheung and Anthony Oates and Rue Huang},
  title = {Frequency Modulated Charge Pumping with Extremely High Gate Leakage},
  year = {2015},
  month = {2015-02-13},
  publisher = {IEEE Transactions on Electron Devices},
  url = {https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=915883},
  language = {en},
}