@conference{68796,
  author = {Dean Jarrett and Marlin Kraft and Isabel Castro and Brett Degler and Mark Evans},
  title = {Procedures for the Traceability of High Resistance Standards Using a Teraohmmeter},
  year = {2008},
  month = {2008-08-01},
  publisher = {NCSL International Workshop and Symposium, Orlando, FL},
  url = {https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=33020},
  language = {en},
}